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JIS C 5630-6-2011

$22.00

The files are in electronic format(PDF/DOC/DOCX) and will be sent to your email within hours.
JIS Standard Title:Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
JIS Standard NO.:JIS C 5630-6
Language:Japanese


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  • 1000 Units in Stock


This product was added to our catalog on Sunday 18 January, 2015.

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