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JIS H 0604-1995 (R 2009)(R 2014)

Product 5362/10786

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$22.00

The files are in electronic format(PDF/DOC/DOCX) and will be sent to your email within hours.
JIS Standard Title:Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method
JIS Standard NO.:JIS H 0604
Language:Japanese


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  • 1000 Units in Stock


This product was added to our catalog on Wednesday 14 January, 2015.
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