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JIS C 5630-12-2014

$22.00

The files are in electronic format(PDF/DOC/DOCX) and will be sent to your email within hours.
JIS Standard Title:Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
JIS Standard NO.:JIS C 5630-12
Language:Japanese


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  • 1000 Units in Stock


This product was added to our catalog on Saturday 17 January, 2015.

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