JIS H 0603:1978Measurement of minority carrier life time in germanium by photoconductive decay method
Abstract
This Japanese Industrial Standard specifies the method of minority carrier life time, hereinafter referred to as the "life time", in germanium single crystal by photoconductive decay method. The single crystal to be measured has homogeneous composition and the value of its life time shall be within a range of 5 to 1000 muns.
Details
| Status |
Current |
| Pages |
7 |
| Language |
English |
| Supersedes |
|
| Superseded By |
|
| DocumentFormat |
PDF(Copy/Paste/Networkable) |
| Published |
|
| History |
1978(R2014) [20/10/2014]
1978(R2009) [01/10/2009]
1978(R1999) [20/06/1999]
1978 [01/03/1978] |
Note
We will send the latest version to you, please contact us if you want the exact document as the title. Some old Standards are in scancopy and no reaffirmed stamp
This product was added to our catalog on Saturday 10 March, 2018.
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