JIS C 7030:1993Measuring methods for transistors
Abstract
This Japanese Industrial Standard specifies the measuring methods electrical performances of bipolar transistors and field-effect transistors (hereafter referred to only "transistors" when they are not classified) mainly used in electronic equipment.
Details
| Status |
Current |
| Pages |
101 |
| Language |
English |
| Supersedes |
|
| Superseded By |
|
| DocumentFormat |
PDF(Copy/Paste/Networkable) |
| Published |
|
| History |
1993(R2014) [20/10/2014]
1993(R2009) [01/10/2009]
1993(R1999) [20/06/1999]
1993 [01/02/1993]
1973 |
Note
We will send the latest version to you, please contact us if you want the exact document as the title. Some old Standards are in scancopy and no reaffirmed stamp
This product was added to our catalog on Saturday 10 March, 2018.
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