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JIS K 0131:1996 English Edition

$28.00
JIS K 0131:1996

General rules for X-ray diffractometric analysis

Abstract

This Japanese Industrial Standard specifies the general rules for the measurements of diffracted X-ray using a X-ray diffractometer in order to make the identification and determination, the accurate measurement of lattice constant, and the measurement of crystallinity degree, of substances.

Details

Status Current
Pages 30
Language English
Supersedes
Superseded By
DocumentFormat PDF(Copy/Paste/Networkable)
Published
History


Note
We will send the latest version to you, please contact us if you want the exact document as the title. Some old Standards are in scancopy and no reaffirmed stamp


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This product was added to our catalog on Saturday 10 March, 2018.

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