JIS K 0132:1997General rules for scanning electron microscopy
Abstract
This Japanese Industrial Standard specifies general matters which are needed when the morphological observation and analysis of micro spot on specimen surface are carried out mainly owing to the secondary electrons using a scanning electron microscope.
Details
| Status |
Current |
| Pages |
21 |
| Language |
English |
| Supersedes |
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| Superseded By |
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| DocumentFormat |
PDF(Copy/Paste/Networkable) |
| Published |
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| History |
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Note
We will send the latest version to you, please contact us if you want the exact document as the title. Some old Standards are in scancopy and no reaffirmed stamp
This product was added to our catalog on Saturday 10 March, 2018.
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