JIS R 1633:1998Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
Abstract
This Japanese Industrial Standard specifies the sample preparation method of bulk fine ceramics and fine ceramic powders for scanning electron microscope (SEM) observation using the SEM which is capable f observing the sample not in the dry condition, the volatile sample, and the non-conductive sample, is not provided with any special function nor structure, and is capable of being using under the pressure in the sample chamber of 10*2 Pa or under.
Details
Status |
Current |
Pages |
6 |
Language |
English |
Supersedes |
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Superseded By |
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DocumentFormat |
PDF(Copy/Paste/Networkable) |
Published |
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History |
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Note
We will send the latest version to you, please contact us if you want the exact document as the title. Some old Standards are in scancopy and no reaffirmed stamp
This product was added to our catalog on Saturday 10 March, 2018.