JIS C 5402-2-1:2005Connectors for electronic equipment - Tests and measurements Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method
Abstract
This section of JIS C 5402-2 is to define a standard test method to measure the electrical resistance across a pair of mated contacts or a contact with a measuring gauge. This test may also be used for similar devices when specified in a detail specification.
Details
Status |
Current |
Pages |
3 |
Language |
English |
Supersedes |
|
Superseded By |
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DocumentFormat |
PDF(Copy/Paste/Networkable) |
Published |
20-03-2005 |
History |
2005(R2014) [20/10/2014] 2005(R2009) [01/10/2009] 2005 [20/03/2005] |
Note
We will send the latest version to you, please contact us if you want the exact document as the title. Some old Standards are in scancopy and no reaffirmed stamp
This product was added to our catalog on Saturday 10 March, 2018.