JIS C 5402-6-3:2005Connectors for electronic equipment - Tests and measurements Part 6-3: Dynamic stress tests - Test 6c: Shock
Abstract
This section of JIS C 5402-6 is to define a standard test method to assess the ability of components to withstand specified severities of shock. This test may also be used for similar devices when specified in a detail specification.
Details
Status |
Current |
Pages |
3 |
Language |
English |
Supersedes |
|
Superseded By |
|
DocumentFormat |
PDF(Copy/Paste/Networkable) |
Published |
20-03-2005 |
History |
2005(R2014) [20/10/2014] 2005(R2009) [01/10/2009] 2005 [20/03/2005] |
Note
We will send the latest version to you, please contact us if you want the exact document as the title. Some old Standards are in scancopy and no reaffirmed stamp
This product was added to our catalog on Saturday 10 March, 2018.