JIS C 60068-2-20:2010Environmental testing Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
Abstract
This Japanese Industrial Standard outlines Test T, applicable to devices with leads.
Details
| Status |
Current |
| Pages |
16 |
| Language |
English |
| Supersedes |
JIS C 60068-2-20:1996 |
| Superseded By |
|
| DocumentFormat |
PDF(Copy/Paste/Networkable) |
| Published |
20-05-2010 |
| History |
2010(R2015) [20/10/2015]
2010 [20/05/2010]
96(R2007) [20/03/2007]
96(R2001) [20/02/2001]
96 [01/07/1996]
85 |
Note
We will send the latest version to you, please contact us if you want the exact document as the title. Some old Standards are in scancopy and no reaffirmed stamp
This product was added to our catalog on Saturday 10 March, 2018.
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