English Edition

JIS H 0601:1962 Testing methods of resistivity for germanium Abstract This Japanese Industrial Standard specifies the testing methods of...

JIS H 0604:1995 Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method Abstract This Japanese Industrial...

JIS H 0608:1978 Estimation Of Boron Content In Silicon Abstract Details Status Withdrawn Pages 8 Language English Supersedes ...

JIS H 0610:1966 Method of measurement of etch pit density of germanium crystal Abstract This Japanese Industrial Standard specifies the method of...

JIS H 1051:2005 Methods for determination of copper in copper and copper alloys Abstract This Standard specifies the methods for determination of...