JIS R 1636:1998Test method for thickness of fine ceramic thin films - Film thickness by contact probe profilometer
Abstract
This Japanese Industrial Standard specifies the test method for thickness of fine ceramic thin films by a contact probe profilometer. The applicable range of the film thickness shall be 10 nm to 10000 nm.
Details
Status |
Current |
Pages |
9 |
Language |
English |
Supersedes |
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Superseded By |
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DocumentFormat |
PDF(Copy/Paste/Networkable) |
Published |
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History |
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Note
We will send the latest version to you, please contact us if you want the exact document as the title. Some old Standards are in scancopy and no reaffirmed stamp
This product was added to our catalog on Saturday 10 March, 2018.