JIS C 5402-5-2:2005Connectors for electronic equipment - Tests and measurements Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating
Abstract
This section of JIS C 5402-5 is to detail a standard test method to assess the current-carrying capacity of electromechanical components at elevated ambient temperature. This test may also be used for similar devices when specified in a detail specification.
Details
Status |
Current |
Pages |
5 |
Language |
English |
Supersedes |
|
Superseded By |
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DocumentFormat |
PDF(Copy/Paste/Networkable) |
Published |
20-03-2005 |
History |
2005(R2014) [20/10/2014] 2005(R2009) [01/10/2009] 2005 [20/03/2005] |
Note
We will send the latest version to you, please contact us if you want the exact document as the title. Some old Standards are in scancopy and no reaffirmed stamp
This product was added to our catalog on Saturday 10 March, 2018.